Memory, Microprocessor, and ASIC

Fr. 226.00
ISBN: 978-0-8493-1737-8
+ -

Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools.
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Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools.
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Autor Chen, Wai-Kai (Hrsg.)
Verlag Taylor and Francis
Einband Fester Einband
Erscheinungsjahr 2003
Seitenangabe 384 S.
Lieferstatus Lieferbar in ca. 10-20 Arbeitstagen
Ausgabekennzeichen Englisch
Abbildungen Farb., s/w. Abb.
Masse H25.4 cm x B17.8 cm 864 g
Coverlag CRC Press (Imprint/Brand)
Reihe Principles and Applications in Engineering

Über den Autor Chen, Wai-Kai (Hrsg.)

Wai-Kai Chen

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